Pascal and Francis Bibliographic Databases

Help

Search results

Your search

au.\*:("SUZUKI, Akiyoshi")

Publication Year[py]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Discipline (document) [di]

A-Z Z-A Frequency ↓ Frequency ↑
Export in CSV

Results 1 to 9 of 9

  • Page / 1
Export

Selection :

  • and

The comparison of NGLs from a tool vendor's viewSUZUKI, Akiyoshi.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 7970, issn 0277-786X, isbn 978-0-8194-8529-8, 797005.1-797005.12Conference Paper

Illumination optimization with actual information of exposure tool and resist processTSUJITA, Koichiro; MIKAMI, Koji; NAKA, Ryotaro et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 652036.1-652036.12, issn 0277-786X, isbn 978-0-8194-6639-6Conference Paper

Analyses of imaging performance degradation caused by birefringence residual in lens materialsUNNO, Yasuyuki; SUZUKI, Akiyoshi.SPIE proceedings series. 2001, pp 1306-1317, isbn 0-8194-4032-9, 2VolConference Paper

Comparisons between EUV at-wavelength metrological methodsSUGISAKI, Katsumi; OKADA, Masashi; OUCHI, Chidane et al.Proceedings of SPIE. 2005, pp 59210D.1-59210D.8, isbn 0-8194-5926-7, 1VolConference Paper

Present status of excimer laser exposure apparatusSUZUKI, Akiyoshi.SPIE proceedings series. 2000, pp 154-159, isbn 0-8194-3731-XConference Paper

Impact of optimization conditions on the result at optimizing illumination and maskTSUJITA, Koichiro; MIKAMI, Koji; ISHII, Hiroyuki et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 69242U.1-69242U.12, issn 0277-786X, isbn 978-0-8194-7109-3Conference Paper

Catadioptric projection optical system for flat panel exposure toolKOHNO, Michio; FUKAMI, Kiyoshi; YOSHIOKA, Hitoshi et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, issn 0277-786X, isbn 0-8194-6427-9, Part 1, 63420Y.1-63420Y.9Conference Paper

Experimental comparison of absolute PDI and lateral shearing interferometerYUCONG ZHU; SUGISAKI, Katsumi; HASEGAWA, Masanobu et al.SPIE proceedings series. 2005, isbn 0-8194-5732-9, 3Vol, Part 3, 1192-1199Conference Paper

A new resolution enhancement method realizing the limit of single mask exposureYAMAZOE, Kenji; HASEGAWA, Masanobu; SAITOH, Kenji et al.SPIE proceedings series. 2002, pp 471-482, isbn 0-8194-4517-7, 12 p.Conference Paper

  • Page / 1